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The environmental stability characterization of exfoliated few-layer CrXTe3 (X = Si, Ge) nanosheets

Author:

Yun Liu,Wei Wang,Haoyong Lu,Qiyun Xie,Limin Chen,Handi Yin,Guofeng Cheng,Xiaoshan Wu

Publication:

Applied Surface Science

Publisher:

Elsevier

Date:

1 May 2020

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