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Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree

Author:

Yuanqing Li,Li Chen,Issam Nofal,Mo Chen,Haibin Wang,Rui Liu,Qingyu Chen,Milos Krstic,Shuting Shi,Gang Guo,Sang H. Baeg,Shi-Jie Wen,Richard Wong

Publication:

Microelectronics Reliability

Publisher:

Elsevier

Date:

August 2018

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