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Characterization of vanadium oxide thin films with different stoichiometry using Raman spectroscopy

Author:

Chunzi Zhang,Qiaoqin Yang,Cyril Koughia,Fan Ye,Mohsen Sanayei,Shi-Jie Wen,Safa Kasap

Publication:

Thin Solid Films

Publisher:

Elsevier

Date:

1 December 2016

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