Pose-guided YOLO-CED: A two-stage framework for robust SMD-PCB defect detection in mobile manipulators
Author:
Mingxiao Sun,Qiang Zhao,Qiuyu Zhang,Tiantian Luan
Publication:
Neural Networks
© 2026 Elsevier Ltd. All rights are reserved, including those for text and data mining, AI training, and similar technologies.