Origin of interfacial stress in homoepitaxial GaN grown by Na-flux method
Author:
Xiaohui Peng,Zongliang Liu,Tao Zhang,Kexin Chen,Xiaoming Dong,Mengya Li,Ning Tang,Zhiwei Si,Ke Xu
Publication:
Journal of Materials Science & Technology
Date:
Available online 5 June 2026
© 2026 Published by Elsevier Ltd on behalf of The editorial office of Journal of Materials Science & Technology.