Characterisation of defects in p-GaN by admittance spectroscopy
Author:
O.S. Elsherif,K.D. Vernon-Parry,J.H. Evans-Freeman,R.J. Airey,M. Kappers,C.J. Humphreys
Publication:
Physica B: Condensed Matter
Copyright © 2011 Elsevier B.V. All rights reserved.