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Impact of electron and hole trapping on gate reliability of planar SiC MOSFETs

Author:

Cheng Sung,Yu-Cheng Wang,Shivendra Kumar Singh,Wei-Cheng Lin,Yu-Sheng Hsiao,Surya Elangovan,Yi-Kai Hsiao,Chia-Lung Hung,Hao-Chung Kuo,Chang-Ching Tu,Tian-Li Wu

Publication:

Materials Science in Semiconductor Processing

Publisher:

Elsevier

Date:

July 2026

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