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A data-driven self-terminating write circuit with enhanced reliability for STT-MRAM using MUX logic

Author:

Ravi S. Siddanath,Mohit Gupta,Souvik Kumar Das,G.K. Prasad,Manish Goswami,Kavindra Kandpal

Publication:

Microelectronics Reliability

Publisher:

Elsevier

Date:

February 2026

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