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High-throughput discovery of 2D van der Waals gate dielectrics by interpretable machine learning for sub-1-nm equivalent oxide thickness scaling

Author:

Zhen Wang,Ming Chen,Ziqiang Xu,Jinshun Bi,Wenjun Xiao,Changsong Gao,Abuduwayiti Aierken,Gang Wang,Yan Wu,Liang Zhang,Degui Wang,Xuefei Liu,Mingqiang Liu

Publication:

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Publisher:

Elsevier

Date:

20 October 2026

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