Localization of sensitive areas of power AC switch under thermal laser stimulation
Author:
S. Debleds,J.P. Rebrasse,L. Dantas de Morais,I. Frapreau,R. Perdreau,B. Morillon
Publication:
Microelectronics Reliability
Date:
September–November 2007
Copyright © 2007 Elsevier Ltd. All rights reserved.