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Comparison of OFF-State, HCI and BTI degradation in FDSOI Ω-gate NW-FETs

Author:

C. Valdivieso,A. Crespo-Yepes,R. Miranda,D. Bernal,J. Martin-Martinez,R. Rodriguez,M. Nafria

Publication:

Solid-State Electronics

Publisher:

Elsevier

Date:

August 2022

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