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Oxygen depth profiling by resonant backscattering and glow discharge optical emission spectroscopy of Ti-6Al-4V alloy oxidized by ion implantation and plasma based treatment

Author:

S. Nsengiyumva,M. Topic,L. Pichon,C.M. Comrie,C. Mtshali

Publication:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Publisher:

Elsevier

Date:

1 October 2016

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