Thickness-dependent shift of the ferroelectric composition window in ultrathin Hf1-xZrxO2 thin films
Author:
Gunho Kim,Hyo-Bae Kim,Hye-Won Cho,Hyungseok Lee,Wonwoo Kho,Seung-Eon Ahn,Ji-Hoon Ahn
Publication:
Applied Surface Science
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