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Investigation of hygrothermally induced failures in multilayer ceramic capacitors during thermal reflow process

Author:

Rilwan Kayode Apalowo,Aizat Abas,Zuraihana Bachok,Mohamad Fikri Mohd Sharif,Fakhrozi Che Ani,Mohamad Riduwan Ramli,Muhamed Abdul Fatah bin Muhamed Mukhtar

Publication:

Microelectronics Reliability

Publisher:

Elsevier

Date:

July 2023

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