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Electrical characterization of Al/MEH-PPV/p-Si Schottky diode by current–voltage and capacitance–voltage methods

Author:

Mehmet Enver Aydin,Fahrettin Yakuphanoglu,Jae-Hoon Eom,Do-Hoon Hwang

Publication:

Physica B: Condensed Matter

Publisher:

Elsevier

Date:

1 January 2007

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