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Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography

Author:

Patrick Harrison,Saurabh Mohan Das,William Goncalves,Alessandra da Silva,Xinren Chen,Nicola Viganò,Christian H. Liebscher,Wolfgang Ludwig,Xuyang Zhou,Edgar F. Rauch

Publication:

Ultramicroscopy

Publisher:

Elsevier

Date:

December 2024

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