Evaluating the abrasive wear of Zn1−
x
Mn
x
O heteroepitaxial layers using a nanoscratch technique
Author:
Yu-Ming Chang,Hua-Chiang Wen,Chu-Shou Yang,Derming Lian,Chien-Huang Tsai,Jyh-Shyang Wang,Wen-Fa Wu,Chang-Pin Chou
Publication:
Microelectronics Reliability
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