Disconnection-mediated Twin/Twin-junction migration in FCC metals
Author:
Mingjie Xu,Kongtao Chen,Fan Cao,Leonardo Velasco,Thomas M. Kaufman,Fan Ye,Horst Hahn,Jian Han,David J. Srolovitz,Xiaoqing Pan
Publication:
Acta Materialia
© 2022 The Author(s). Published by Elsevier Ltd on behalf of Acta Materialia Inc.