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Investigation of microscale and nanoscale twin lamellae in monocrystalline silicon grown by Czochralski method

Author:

Yun Liu,Wenkai Liu,Tao Wei,Zhan Li,Minghao Li,Rongwang Dai,Zhongying Xue,Xing Wei

Publication:

Materials Science in Semiconductor Processing

Publisher:

Elsevier

Date:

October 2022

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