Triple junction InGaP/InGaAs/Ge solar cells for high concentration photovoltaics application: Degradation tests of solar receivers
Author:
S. Padovani,A. Del Negro,M. Antonipieri,S. Sinesi,R. Campesato,M.C. Casale,G. Gabetta,G. Gori
Publication:
Microelectronics Reliability
Date:
September–November 2010
Copyright © 2010 Elsevier Ltd. All rights reserved.