Title:

Integrating micro- and nanoelectrodes into atomic force microscopy cantilevers using focused ion beam techniques

Author:

A. Lugstein,E. Bertagnolli,C. Kranz, et al.

Publication:

Applied Physics Letters

Volume/Issue

81/2

Publisher:

AIP Publishing

Date:

Dec 31, 1969

Page Count:

3

Rights managed by AIP Publishing.
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